Versatile March Test Generator for Hands-on Memory Testing Laboratory

Jean-Marc Galliere 1 Luigi Dilillo 1
1 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
Abstract : Generally, in the studies of microelectronics engineer the approach of IC testing remains very theoretical. Only few concrete practices are commonly done and generally laboratory experiences are limited to the use of CAD tools. For this purpose, in our teaching department, we develop an experiment allowing a concrete learning of IC testing dedicated to the test of commercial memory chips. Through this environment, our students reached a better knowledge of the connection between the test sequences and the detected faults.
Type de document :
Communication dans un congrès
IEEE International Conference on Microelectronic Systems Education, Jun 2011, San Diego, CA, United States. IEEE, pp.41-42, 2011, 〈http://www.mseconference.org/〉
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00805300
Contributeur : Luigi Dilillo <>
Soumis le : mercredi 27 mars 2013 - 15:37:02
Dernière modification le : jeudi 11 janvier 2018 - 06:27:19

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  • HAL Id : lirmm-00805300, version 1

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Jean-Marc Galliere, Luigi Dilillo. Versatile March Test Generator for Hands-on Memory Testing Laboratory. IEEE International Conference on Microelectronic Systems Education, Jun 2011, San Diego, CA, United States. IEEE, pp.41-42, 2011, 〈http://www.mseconference.org/〉. 〈lirmm-00805300〉

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