A Built-in Scheme for Testing and Repairing Voltage Regulators of Low-Power SRAMs

Leonardo Zordan 1 Alberto Bosio 1 Luigi Dilillo 1 Patrick Girard 1 Aida Todri-Sanial 1 Arnaud Virazel 1 Nabil Badereddine 2
1 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
2 IMC - Intel Mobile Communications
Abstract : Voltage regulation systems offer an efficient mechanism for reducing static power consumption of SRAMs. When the SRAM is not accessed for a long period, it switches into an intermediate low-power mode. In this mode, a voltage regulator is used to reduce the voltage supplied to the core-cell array as low as possible without data loss. Therefore, reliable operation of such device must be ensured by using adequate test techniques. In this work, we propose low area overhead built-in self-test (BIST) and built-in self-repair (BISR) schemes that can be embedded on the SRAM to automatically test and repair the voltage regulator. Simulation results prove the effectiveness of the proposed technique for detecting, diagnosing and repairing voltage regulators of low-power SRAMs.
Keywords : memory test SRAM low-power design design for testability
Type de document :
Communication dans un congrès
VTS: VLSI Test Symposium, Apr 2013, Berkeley, CA, United States. pp.1-6, 2013, VLSI Test Symposium (VTS), 2013 IEEE 31st. 〈http://www.tttc-vts.org/public_html/new/2013/index.php〉. 〈10.1109/VTS.2013.6548894〉
Liste complète des métadonnées
https://hal-lirmm.ccsd.cnrs.fr/lirmm-00805366
Contributeur : Luigi Dilillo <>
Soumis le : mercredi 27 mars 2013 - 17:18:17
Dernière modification le : jeudi 28 juin 2018 - 18:44:07

Identifiants

Collections

SYSMIC | LIRMM | LIRMM_MIC | MIC | MIPS | UNIV-MONTPELLIER | SMARTIES | TEST

Citation

Leonardo Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, et al.. A Built-in Scheme for Testing and Repairing Voltage Regulators of Low-Power SRAMs. VTS: VLSI Test Symposium, Apr 2013, Berkeley, CA, United States. pp.1-6, 2013, VLSI Test Symposium (VTS), 2013 IEEE 31st. 〈http://www.tttc-vts.org/public_html/new/2013/index.php〉. 〈10.1109/VTS.2013.6548894〉. 〈lirmm-00805366〉

Exporter

BibTeX TEI DC DCterms EndNote

Partager

Métriques

Consultations de la notice

242

Contact

support.ccsd.cnrs.fr
hal.support@ccsd.cnrs.fr
Logo CCSD