A Built-in Scheme for Testing and Repairing Voltage Regulators of Low-Power SRAMs

Abstract : Voltage regulation systems offer an efficient mechanism for reducing static power consumption of SRAMs. When the SRAM is not accessed for a long period, it switches into an intermediate low-power mode. In this mode, a voltage regulator is used to reduce the voltage supplied to the core-cell array as low as possible without data loss. Therefore, reliable operation of such device must be ensured by using adequate test techniques. In this work, we propose low area overhead built-in self-test (BIST) and built-in self-repair (BISR) schemes that can be embedded on the SRAM to automatically test and repair the voltage regulator. Simulation results prove the effectiveness of the proposed technique for detecting, diagnosing and repairing voltage regulators of low-power SRAMs.
Type de document :
Communication dans un congrès
VTS: VLSI Test Symposium, Apr 2013, Berkeley, CA, United States. pp.1-6, 2013, VLSI Test Symposium (VTS), 2013 IEEE 31st. 〈http://www.tttc-vts.org/public_html/new/2013/index.php〉. 〈10.1109/VTS.2013.6548894〉
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00805366
Contributeur : Luigi Dilillo <>
Soumis le : mercredi 27 mars 2013 - 17:18:17
Dernière modification le : vendredi 2 mars 2018 - 19:36:02

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Leonardo Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, et al.. A Built-in Scheme for Testing and Repairing Voltage Regulators of Low-Power SRAMs. VTS: VLSI Test Symposium, Apr 2013, Berkeley, CA, United States. pp.1-6, 2013, VLSI Test Symposium (VTS), 2013 IEEE 31st. 〈http://www.tttc-vts.org/public_html/new/2013/index.php〉. 〈10.1109/VTS.2013.6548894〉. 〈lirmm-00805366〉

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