Defect Analysis in Power Mode Control Logic of Low-Power SRAMs

Abstract : Summary form only given. Low-power SRAMs embed power gating mechanisms for reducing static power consumption. Power gating is applied in SRAMs using power switches for controlling the supply voltage applied to the various memory blocks (array, decoders, I/O logic, etc.). This paper provides a detailed analysis based on electrical simulations to describe the impacts of resistive-open defects on the power mode control logic, which generates control signals of power switches.
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00805374
Contributor : Luigi Dilillo <>
Submitted on : Wednesday, March 27, 2013 - 5:38:19 PM
Last modification on : Wednesday, December 11, 2019 - 1:32:02 AM

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Leonardo B. Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, et al.. Defect Analysis in Power Mode Control Logic of Low-Power SRAMs. ETS: European Test Symposium, May 2012, Annecy, France. ⟨10.1109/ETS.2012.6233033⟩. ⟨lirmm-00805374⟩

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