A Pseudo-Dynamic Comparator for Error Detection in Fault Tolerant Architectures

Abstract : Although CMOS technology scaling offers many advantages, it suffers from robustness problem caused by hard, soft and timing errors. The robustness of future CMOS technology nodes must be improved and the use of fault tolerant architectures is probably the most viable solution. In this context, Duplication/Comparison scheme is widely used for error detection. Traditionally, this scheme uses a static comparator structure that detects hard error. However, it is not effective for soft and timing errors detection due to the possible masking of glitches by the comparator itself. To solve this problem, we propose a pseudo-dynamic comparator architecture that combines a dynamic CMOS transition detector and a static comparator. Experimental results show that the proposed comparator detects not only hard errors but also small glitches related to soft and timing errors. Moreover, its dynamic characteristics allow reducing the power consumption while keeping an equivalent silicon area compared to a static comparator. This study is the first step towards a full fault tolerant approach targeting robustness improvement of CMOS logic circuits.
Type de document :
Communication dans un congrès
VTS: VLSI Test Symposium, Apr 2012, Hawaii, United States. VLSI Test Symposium (VTS), 2012 IEEE 30th, pp.50-55, 2012, 〈10.1109/VTS.2012.6231079〉
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00806778
Contributeur : Arnaud Virazel <>
Soumis le : mardi 2 avril 2013 - 12:30:38
Dernière modification le : mardi 25 septembre 2018 - 14:30:02

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Ahn Duc Tran, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. A Pseudo-Dynamic Comparator for Error Detection in Fault Tolerant Architectures. VTS: VLSI Test Symposium, Apr 2012, Hawaii, United States. VLSI Test Symposium (VTS), 2012 IEEE 30th, pp.50-55, 2012, 〈10.1109/VTS.2012.6231079〉. 〈lirmm-00806778〉

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