Skip to Main content Skip to Navigation
Conference papers

Resistive-Open Defect Analysis for Through-Silicon-Vias

Complete list of metadatas

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00806803
Contributor : Arnaud Virazel <>
Submitted on : Tuesday, April 2, 2013 - 1:44:29 PM
Last modification on : Wednesday, December 11, 2019 - 1:32:02 AM

Identifiers

  • HAL Id : lirmm-00806803, version 1

Collections

Citation

Carolina Momo Metzler, Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. Resistive-Open Defect Analysis for Through-Silicon-Vias. DCIS: Design of Circuits and Integrated Systems, 2012, Avignon, France. ⟨lirmm-00806803⟩

Share

Metrics

Record views

92