Impacts of Resistive-Open Defects in the Word-Line Selection of TAS-MRAMs - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2012
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lirmm-00806842 , version 1 (02-04-2013)

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  • HAL Id : lirmm-00806842 , version 1

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João Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. Impacts of Resistive-Open Defects in the Word-Line Selection of TAS-MRAMs. Colloque GDR SoC-SiP, 2012, Paris, France. ⟨lirmm-00806842⟩
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