Impacts of Resistive-Open Defects in the Word-Line Selection of TAS-MRAMs - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier
Conference Papers Year : 2012

Impacts of Resistive-Open Defects in the Word-Line Selection of TAS-MRAMs

Domains

Micro and nanotechnologies/Microelectronics

Arnaud Virazel  : Connect in order to contact the contributor

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00806842

Submitted on : Tuesday, April 2, 2013-2:50:52 PM

Last modification on : Friday, March 24, 2023-2:52:57 PM

No file

Dates and versions

lirmm-00806842 , version 1 (02-04-2013)

Identifiers

  • HAL Id : lirmm-00806842 , version 1

Cite

João Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. Impacts of Resistive-Open Defects in the Word-Line Selection of TAS-MRAMs. Colloque GDR SoC-SiP, 2012, Paris, France. ⟨lirmm-00806842⟩

Export

BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite

Collections

CNRS SYSMIC LIRMM LIRMM_MIC MIC MIPS UNIV-MONTPELLIER EC_LYON_STRICT
117 View
0 Download

Share

More