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Impacts of Resistive-Open Defects in the Word-Line Selection of TAS-MRAMs

João Azevedo 1 Arnaud Virazel 1 Alberto Bosio 1 Luigi Dilillo 1 Patrick Girard 1 Aida Todri-Sanial 1
1 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00806842
Contributor : Arnaud Virazel <>
Submitted on : Tuesday, April 2, 2013 - 2:50:52 PM
Last modification on : Friday, November 27, 2020 - 6:04:03 PM

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  • HAL Id : lirmm-00806842, version 1

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João Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. Impacts of Resistive-Open Defects in the Word-Line Selection of TAS-MRAMs. Colloque GDR SoC-SiP, 2012, Paris, France. ⟨lirmm-00806842⟩

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