Conference Papers
Year : 2012
Arnaud Virazel : Connect in order to contact the contributor
https://hal-lirmm.ccsd.cnrs.fr/lirmm-00806842
Submitted on : Tuesday, April 2, 2013-2:50:52 PM
Last modification on : Friday, March 24, 2023-2:52:57 PM
Dates and versions
Identifiers
- HAL Id : lirmm-00806842 , version 1
Cite
João Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. Impacts of Resistive-Open Defects in the Word-Line Selection of TAS-MRAMs. Colloque GDR SoC-SiP, 2012, Paris, France. ⟨lirmm-00806842⟩
Collections
117
View
0
Download