Adaptive Voltage Scaling via Effective On-Chip Timing Uncertainty Measurements - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2012

Adaptive Voltage Scaling via Effective On-Chip Timing Uncertainty Measurements

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lirmm-00806859 , version 1 (02-04-2013)

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  • HAL Id : lirmm-00806859 , version 1

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Miroslav Valka, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, et al.. Adaptive Voltage Scaling via Effective On-Chip Timing Uncertainty Measurements. Colloque GDR SoC-SiP, 2012, Paris, France. ⟨lirmm-00806859⟩
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