Fault Localization Improvement through an Intra-Cell Diagnosis Approach

Abstract : Logic diagnosis is the process of isolating the source of observed errors in a defective circuit, so that a physical failure analysis can be performed to determine the root cause of such errors. In this paper, we propose a new "Effect-Cause" based intra-cell diagnosis approach to improve the defect localization accuracy. The proposed approach is based on the Critical Path Tracing (CPT) here applied at transistor level. It leads to a precise localization of the root cause of observed errors. Experimental results show the efficiency of our approach.
Type de document :
Communication dans un congrès
38th International Symposium for Testing and Failure Analysis, Nov 2012, United States. pp.509-519, 2012
Liste complète des métadonnées

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00806863
Contributeur : Alberto Bosio <>
Soumis le : mardi 2 avril 2013 - 15:00:31
Dernière modification le : jeudi 11 janvier 2018 - 02:08:13

Identifiants

  • HAL Id : lirmm-00806863, version 1

Collections

Citation

Zhenzhou Sun, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, et al.. Fault Localization Improvement through an Intra-Cell Diagnosis Approach. 38th International Symposium for Testing and Failure Analysis, Nov 2012, United States. pp.509-519, 2012. 〈lirmm-00806863〉

Partager

Métriques

Consultations de la notice

130