Fault Localization Improvement through an Intra-Cell Diagnosis Approach

Abstract : Logic diagnosis is the process of isolating the source of observed errors in a defective circuit, so that a physical failure analysis can be performed to determine the root cause of such errors. In this paper, we propose a new "Effect-Cause" based intra-cell diagnosis approach to improve the defect localization accuracy. The proposed approach is based on the Critical Path Tracing (CPT) here applied at transistor level. It leads to a precise localization of the root cause of observed errors. Experimental results show the efficiency of our approach.
Complete list of metadatas

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00806863
Contributor : Alberto Bosio <>
Submitted on : Tuesday, April 2, 2013 - 3:00:31 PM
Last modification on : Wednesday, December 11, 2019 - 1:32:02 AM

Identifiers

  • HAL Id : lirmm-00806863, version 1

Collections

Citation

Zhenzhou Sun, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, et al.. Fault Localization Improvement through an Intra-Cell Diagnosis Approach. 38th International Symposium for Testing and Failure Analysis, Nov 2012, United States. pp.509-519. ⟨lirmm-00806863⟩

Share

Metrics

Record views

230