Fault Localization Improvement through an Intra-Cell Diagnosis Approach - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2012

Fault Localization Improvement through an Intra-Cell Diagnosis Approach

Abstract

Logic diagnosis is the process of isolating the source of observed errors in a defective circuit, so that a physical failure analysis can be performed to determine the root cause of such errors. In this paper, we propose a new "Effect-Cause" based intra-cell diagnosis approach to improve the defect localization accuracy. The proposed approach is based on the Critical Path Tracing (CPT) here applied at transistor level. It leads to a precise localization of the root cause of observed errors. Experimental results show the efficiency of our approach.
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Dates and versions

lirmm-00806863 , version 1 (02-04-2013)

Identifiers

  • HAL Id : lirmm-00806863 , version 1

Cite

Zhenzhou Sun, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, et al.. Fault Localization Improvement through an Intra-Cell Diagnosis Approach. ISTFA 2012 - 38th International Symposium for Testing and Failure Analysis, Nov 2012, Phoenix, AZ, United States. pp.509-519. ⟨lirmm-00806863⟩
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