Stéphane David-Grignot, Florence Azaïs, Laurent Latorre, François Lefevre. Analog Measurements based on Digital Test Equipment for Low-Cost Testing of Analog/RF Circuits.
ETS: European Test Symposium, May 2013, Avignon, France. 18th IEEE European Test Symposium, 2013.
⟨lirmm-00820084⟩