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A Comparative Analysis of Indirect Measurement Selection Strategies for Analog/RF Alternate Testing

Syhem Larguech 1 Florence Azaïs 1 Serge Bernard 1 Vincent Kerzérho 1 Mariane Comte 1 Michel Renovell 1
1 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00985422
Contributor : Florence Azais <>
Submitted on : Tuesday, April 29, 2014 - 4:20:44 PM
Last modification on : Thursday, August 29, 2019 - 1:18:18 AM

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  • HAL Id : lirmm-00985422, version 1

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Syhem Larguech, Florence Azaïs, Serge Bernard, Vincent Kerzérho, Mariane Comte, et al.. A Comparative Analysis of Indirect Measurement Selection Strategies for Analog/RF Alternate Testing. 3rd IEEE International Workshop on Test and Validation of High Speed Analog Circuits, Sep 2013, Anaheim, CA, United States. ⟨lirmm-00985422⟩

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