A Comparative Analysis of Indirect Measurement Selection Strategies for Analog/RF Alternate Testing - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2013

A Comparative Analysis of Indirect Measurement Selection Strategies for Analog/RF Alternate Testing

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Micro and nanotechnologies/Microelectronics

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00985422

Submitted on : Tuesday, April 29, 2014-4:20:44 PM

Last modification on : Friday, March 24, 2023-2:52:58 PM

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lirmm-00985422 , version 1 (29-04-2014)

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  • HAL Id : lirmm-00985422 , version 1

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Syhem Larguech, Florence Azaïs, Serge Bernard, Vincent Kerzérho, Mariane Comte, et al.. A Comparative Analysis of Indirect Measurement Selection Strategies for Analog/RF Alternate Testing. 3rd IEEE International Workshop on Test and Validation of High Speed Analog Circuits, Sep 2013, Anaheim, CA, United States. ⟨lirmm-00985422⟩

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