TSVs Pre-Bond Testing: a test scheme for capturing BIST responses

Giorgio Di Natale 1 Marie-Lise Flottes 1 Bruno Rouzeyre 1 Hakim Zimouche 1
1 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
Abstract : The proposed test method aims to detect TSV defects without requiring any contact from a probe-card and thus allows pre-bond testing before wafer thinning. As in previous proposals from the literature, the TSV under test is used by the proposed DfT scheme as a capacitive load and the measure of its charge/discharge delay is used as an indirect measure of its RC parameters. The proposed solution allows testing TSVs individually and at the same time with a small impact of the area overhead for the associated DfT.
Type de document :
Communication dans un congrès
3D-Test: Testing Three-Dimensional Stacked Integrated Circuits, Sep 2013, Anaheim, United States. IEEE, Fourth IEEE International Workshop on Testing Three-Dimensional Stacked Integrated Circuits 3D-Test in conjunction with ITC / Test Week 2013 September 12-13, 2013 - Disneyland Hotel – Anaheim, California, USA, 2013, 〈http://www.pld.ttu.ee/3dtest/past_events/2013/〉
Liste complète des métadonnées

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00989707
Contributeur : Marie-Lise Flottes <>
Soumis le : lundi 12 mai 2014 - 11:58:26
Dernière modification le : jeudi 11 janvier 2018 - 06:27:19

Identifiants

  • HAL Id : lirmm-00989707, version 1

Collections

Citation

Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre, Hakim Zimouche. TSVs Pre-Bond Testing: a test scheme for capturing BIST responses. 3D-Test: Testing Three-Dimensional Stacked Integrated Circuits, Sep 2013, Anaheim, United States. IEEE, Fourth IEEE International Workshop on Testing Three-Dimensional Stacked Integrated Circuits 3D-Test in conjunction with ITC / Test Week 2013 September 12-13, 2013 - Disneyland Hotel – Anaheim, California, USA, 2013, 〈http://www.pld.ttu.ee/3dtest/past_events/2013/〉. 〈lirmm-00989707〉

Partager

Métriques

Consultations de la notice

50