Layout-Aware Laser Fault Injection Simulation and Modeling: from physical level to gate level

Feng Lu 1 Giorgio Di Natale 1 Marie-Lise Flottes 1 Bruno Rouzeyre 1
1 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
Abstract : Fault injection is a technique used by hackers to retrieve secret information in circuits implementing cryptographic algorithms. In particular, laser illuminations have been proven to be a very efficient mean to perform such attacks. In this paper, we present a complete laser-induced fault simulation flow geared towards the evaluation of the resistance of devices against such illuminations at design stage. For that, an accurate physical level modeling of the interaction between lasers and silicon is proposed taking into account both laser spot parameters and position and layout information. The models are abstracted at electrical and temporal/logic levels and included in a multi-level simulator.
Complete list of metadatas

https://hal-lirmm.ccsd.cnrs.fr/lirmm-01119592
Contributor : Bruno Rouzeyre <>
Submitted on : Monday, February 23, 2015 - 3:21:18 PM
Last modification on : Monday, July 22, 2019 - 10:56:25 AM

Identifiers

Collections

Citation

Feng Lu, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre. Layout-Aware Laser Fault Injection Simulation and Modeling: from physical level to gate level. DTIS: Design and Technology of Integrated Systems in Nanoscale Era, May 2014, Santorin, Greece. ⟨10.1109/DTIS.2014.6850665⟩. ⟨lirmm-01119592⟩

Share

Metrics

Record views

179