Layout-Aware Laser Fault Injection Simulation and Modeling: from physical level to gate level

Feng Lu 1 Giorgio Di Natale 1 Marie-Lise Flottes 1 Bruno Rouzeyre 1
1 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
Abstract : Fault injection is a technique used by hackers to retrieve secret information in circuits implementing cryptographic algorithms. In particular, laser illuminations have been proven to be a very efficient mean to perform such attacks. In this paper, we present a complete laser-induced fault simulation flow geared towards the evaluation of the resistance of devices against such illuminations at design stage. For that, an accurate physical level modeling of the interaction between lasers and silicon is proposed taking into account both laser spot parameters and position and layout information. The models are abstracted at electrical and temporal/logic levels and included in a multi-level simulator.
Type de document :
Communication dans un congrès
DTIS: Design and Technology of Integrated Systems in Nanoscale Era, May 2014, Santorin, Greece. IEEE, 9th IEEE International Conference on Design and Technology of Integrated Systems in Nanoscale Era, 2014, 〈10.1109/DTIS.2014.6850665〉
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-01119592
Contributeur : Bruno Rouzeyre <>
Soumis le : lundi 23 février 2015 - 15:21:18
Dernière modification le : jeudi 11 janvier 2018 - 06:27:19

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Feng Lu, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre. Layout-Aware Laser Fault Injection Simulation and Modeling: from physical level to gate level. DTIS: Design and Technology of Integrated Systems in Nanoscale Era, May 2014, Santorin, Greece. IEEE, 9th IEEE International Conference on Design and Technology of Integrated Systems in Nanoscale Era, 2014, 〈10.1109/DTIS.2014.6850665〉. 〈lirmm-01119592〉

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