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SEE on Different Layers of Stacked-SRAMs

Viyas Gupta 1 Alexandre Louis Bosser 2 Georgios Tsiligiannis 1 Mathias Rousselet Ali Mohammadzadeh Arto Javanainen Ari Virtanen Helmut Puchner Frédéric Saigné 3, 4 Frédéric Wrobel 4 Luigi Dilillo 1 
1 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
2 TEST - Test and dEpendability of microelectronic integrated SysTems
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
3 RADIAC - Radiations et composants
IES - Institut d’Electronique et des Systèmes
Abstract : This paper presents heavy-ion and proton radiation test results of a 90 nm COTS SRAM with stacked structure. Radiation tests were made using high penetration heavy-ion cocktails at the HIF (Belgium) and at RADEF (Finland) as well as low energy protons at RADEF. The heavy-ion SEU cross-section showed an unusual profile with a peak at the lowest LET (heavy-ion with the highest penetration range). The discrepancy is due to the fact that the SRAM is constituted of two vertically stacked dice. The impact of proton testing on the response of both stacked dice is presented. The results are discussed and the SEU cross-sections of the upper and lower layers are compared. The impact of the stacked structure on the proton SEE rate is investigated.
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Submitted on : Monday, January 11, 2016 - 6:16:19 PM
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Viyas Gupta, Alexandre Louis Bosser, Georgios Tsiligiannis, Mathias Rousselet, Ali Mohammadzadeh, et al.. SEE on Different Layers of Stacked-SRAMs. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2015, 62 (6), pp.2673-2678. ⟨10.1109/TNS.2015.2496725⟩. ⟨lirmm-01254148⟩



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