Exploring the impact of functional test programs re-used for power-aware testing

Aymen Touati 1 Alberto Bosio 1 Luigi Dilillo 1 Patrick Girard 1 Arnaud Virazel 1 Paolo Bernardi 2 Matteo Sonza Reorda 2
1 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
2 DET - Dipartimento di Elettronica e Telecomunicazioni [Turin]
Abstract : High power consumption during at-speed delay fault testing may lead to yield loss and premature aging. On the other hand, reducing too much test power might lead to test escape and reliability problems. Thus, to avoid these issues, test power has to map the power consumed during functional mode. Existing works target the generation of functional test programs able to maximize the power consumption in functional mode of microprocessor cores. The obtained power consumption will be used as threshold to tune the power consumed during testing. This paper investigates the impact of re-using such functional test programs for testing purposes. We propose to apply them by exploiting existing DfT architecture to maximize the delay fault coverage. Then, we combine them with the classical at-speed LOC and LOS delay fault testing schemes to further increase the fault coverage. Results show that it is possible to achieve a global test solution able to maximize the delay fault coverage while respecting the functional power budget.
Keywords : Microprocessor cores High power consumption Functional test programs Functional power budget At-speed delay fault testing Power engineering computing Power aware computing Microprocessor chips Integrated circuit testing Microprocessors Flip-flops Power demand Circuit faults Clocks Delays Testing ATPG Functional and Structural test Power Aware Test Microprocessor test Power-aware testing Premature aging Yield loss
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Conference papers
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-01272937
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Submitted on : Tuesday, May 17, 2016 - 3:19:33 PM
Last modification on : Wednesday, August 28, 2019 - 3:46:02 PM

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LIRMM | CNRS | SYSMIC | LIRMM_MIC | MIC | MIPS | UNIV-MONTPELLIER | TEST

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Aymen Touati, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel, et al.. Exploring the impact of functional test programs re-used for power-aware testing. DATE: Design, Automation and Test in Europe, Mar 2015, Grenoble, France. pp.1277-1280, ⟨10.7873/DATE.2015.1031⟩. ⟨lirmm-01272937⟩

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