Exploring the impact of functional test programs re-used for power-aware testing

Aymen Touati 1 Alberto Bosio 1 Luigi Dilillo 1 Patrick Girard 1 Arnaud Virazel 1 Paolo Bernardi 2 Matteo Sonza Reorda 2
1 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
2 DET - Dipartimento di Elettronica e Telecomunicazioni [Turin]
Abstract : High power consumption during at-speed delay fault testing may lead to yield loss and premature aging. On the other hand, reducing too much test power might lead to test escape and reliability problems. Thus, to avoid these issues, test power has to map the power consumed during functional mode. Existing works target the generation of functional test programs able to maximize the power consumption in functional mode of microprocessor cores. The obtained power consumption will be used as threshold to tune the power consumed during testing. This paper investigates the impact of re-using such functional test programs for testing purposes. We propose to apply them by exploiting existing DfT architecture to maximize the delay fault coverage. Then, we combine them with the classical at-speed LOC and LOS delay fault testing schemes to further increase the fault coverage. Results show that it is possible to achieve a global test solution able to maximize the delay fault coverage while respecting the functional power budget.
Keywords : microprocessor test Power Aware Test Functional and Structural test ATPG Testing Delays Clocks Circuit faults Power demand Flip-flops Microprocessors integrated circuit testing microprocessor chips power aware computing power engineering computing at-speed delay fault testing functional power budget functional test programs high power consumption microprocessor cores power-aware testing premature aging yield loss
Document type :
Conference papers
Complete list of metadatas
https://hal-lirmm.ccsd.cnrs.fr/lirmm-01272937
Contributor : <>
Submitted on : Tuesday, May 17, 2016 - 3:19:33 PM
Last modification on : Friday, March 22, 2019 - 3:12:02 PM

Identifiers

  • HAL Id : lirmm-01272937, version 1

Collections

LIRMM | SYSMIC | LIRMM_MIC | MIC | MIPS | UNIV-MONTPELLIER | TEST

Citation

Aymen Touati, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel, et al.. Exploring the impact of functional test programs re-used for power-aware testing. DATE: Design, Automation and Test in Europe, Mar 2015, Grenoble, France. pp.1277-1280. ⟨lirmm-01272937⟩

Export

BibTeX TEI DC DCterms EndNote

Share

Metrics

Record views

163

Contact

support.ccsd.cnrs.fr
hal.support@ccsd.cnrs.fr
Logo CCSD