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Conference papers
Improving sensor noise analysis for CT-Scanner identification
Abstract : CT-Scanner devices produce three-dimensional images of the internal structure of the body. In this paper, we propose a method that is based on the analysis of sensor noise to identify the CT-Scanner device. For each CT-scanner we built a reference pattern noise and a correlation map from its slices. Finally, we can correlate any test slice with the reference pattern noise of each device according to its correlation map. This correlation map gives a weighting for each pixel regarding its position in the reference pattern noise. We used a wavelet-based Wiener filter and an edge detection method to extract the noise from a slice. Experiments were applied on three CT-Scanners with 40 3D images, including 3600 slices, and we demonstrate that we are able to identify each CT-Scanner separately.
Cited literature [18 references]
https://hal-lirmm.ccsd.cnrs.fr/lirmm-01379558
Contributor : William Puech <>
Submitted on : Wednesday, March 27, 2019 - 2:16:23 PM
Last modification on : Wednesday, March 27, 2019 - 2:28:22 PM
Document(s) archivé(s) le : Friday, June 28, 2019 - 2:34:45 PM
Contributor : William Puech <>
Submitted on : Wednesday, March 27, 2019 - 2:16:23 PM
Last modification on : Wednesday, March 27, 2019 - 2:28:22 PM
Document(s) archivé(s) le : Friday, June 28, 2019 - 2:34:45 PM
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07362817.pdf
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