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Proton-Induced Single-Event Degradation in SDRAMs

Abstract : Retention time and cell functionality degradation under proton irradiation is studied for SDRAM references that exhibit in-flight faulty behavior on satellites. Proton irradiation, with an adapted test protocol, allows to reproduce these effects and to gain a valuable insight on this phenomenon. Data acquired allow for a physical interpretation of the degradation, which results of one or more damage clusters created by a single particle.
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Contributor : Luigi Dilillo <>
Submitted on : Monday, October 17, 2016 - 11:54:01 AM
Last modification on : Monday, July 5, 2021 - 3:44:03 PM




Axel Rodriguez, Frédéric Wrobel, Anne Samaras, Francoise Bezerra, Benjamin Vandevelde, et al.. Proton-Induced Single-Event Degradation in SDRAMs. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2016, 63 (4), pp.2115-2121. ⟨10.1109/TNS.2016.2551733⟩. ⟨lirmm-01382563⟩



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