Proton-Induced Single-Event Degradation in SDRAMs

Abstract : Retention time and cell functionality degradation under proton irradiation is studied for SDRAM references that exhibit in-flight faulty behavior on satellites. Proton irradiation, with an adapted test protocol, allows to reproduce these effects and to gain a valuable insight on this phenomenon. Data acquired allow for a physical interpretation of the degradation, which results of one or more damage clusters created by a single particle.
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IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2016, 63 (4), pp.2115-2121. 〈10.1109/TNS.2016.2551733〉
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-01382563
Contributeur : Luigi Dilillo <>
Soumis le : lundi 17 octobre 2016 - 11:54:01
Dernière modification le : jeudi 11 janvier 2018 - 06:27:29

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Axel Rodriguez, Frédéric Wrobel, Anne Samaras, Francoise Bezerra, Benjamin Vandevelde, et al.. Proton-Induced Single-Event Degradation in SDRAMs. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2016, 63 (4), pp.2115-2121. 〈10.1109/TNS.2016.2551733〉. 〈lirmm-01382563〉

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