Aging effects in FPGAs: an experimental analysis - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2014

Aging effects in FPGAs: an experimental analysis


Modern Field Programmable Gate Arrays (FP-GAs) are built using the most advanced technology nodes to meet performance and power demands. This makes them susceptible to various reliability challenges at nano-scale, and in particular to transistor aging. In this paper, an experimental analysis is made to identify the main parameters and phenomena influencing the performance degradation of FPGAs. For that purpose, a set of controlled ring-oscillator-based sensors with different frequencies and tunable activity control are implemented on a Spartan-6 FPGA. Thus, the internal switching activities (SAs) and signal probabilities (SPs) of the sensors can be varied. We performed accelerated-lifetime conditions using elevated temperatures and voltages in a controlled setting to stress the FPGA. A novel monitoring method based on measuring the electromagnetic emissions of the FPGA is used to accurately monitor the performance of the sensors before and after the stress. The experiments reveal the extent of performance degradations, the impact of SPs and SAs, and the relative impacts of BTI and HCI aging factors.
Fichier principal
Vignette du fichier
06927390.pdf (3.59 Mo) Télécharger le fichier
Origin : Files produced by the author(s)

Dates and versions

lirmm-01421134 , version 1 (21-12-2016)



Abdulazim Amouri, Florent Bruguier, Saman Kiamehr, Pascal Benoit, Lionel Torres, et al.. Aging effects in FPGAs: an experimental analysis. FPL: Field Programmable Logic and Applications, Sep 2014, Munich, Germany. ⟨10.1109/FPL.2014.6927390⟩. ⟨lirmm-01421134⟩
625 View
638 Download



Gmail Facebook X LinkedIn More