A Bulk Built-in Sensor for Detection of Fault Attacks

This work presents a novel scheme of built-in current sensor (BICS) for detecting transient fault-based attacks of short and long duration as well as from different simultaneous sources. The new sensor is a single mechanism connected to PMOS and NMOS bulks of the monitored logic. The proposed protection strategy is also useful for improving any state-of-the-art Bulk-BICS from pairs of PMOS and NMOS sensors to single sensors.

Mots clés

Built-in current sensors concurrent detection fault attacks fault tolerance security soft errors transient faults

Domaines

Micro et nanotechnologies/Microélectronique

Fichier principal

06581565.pdf (613.28 Ko)

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-01430800

Soumis le : mardi 10 janvier 2017-11:53:32

Dernière modification le : jeudi 4 avril 2024-21:04:25

Archivage à long terme le : mardi 11 avril 2017-14:18:17

Dates et versions

lirmm-01430800 , version 1 (10-01-2017)

Identifiants

HAL Id : lirmm-01430800 , version 1
DOI : 10.1109/HST.2013.6581565

Citer

Rodrigo Possamai Bastos, Frank Sill Torres, Jean Max Dutertre, Marie-Lise Flottes, Giorgio Di Natale, et al.. A Bulk Built-in Sensor for Detection of Fault Attacks. HOST: Hardware-Oriented Security and Trust, Jun 2013, Austin, TX, United States. pp.51-54, ⟨10.1109/HST.2013.6581565⟩. ⟨lirmm-01430800⟩

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