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Proceedings of IEEE European Test Symposium (ETS 2016)

Said Hamdioui 1 Maria Michael 2 Giorgio Di Natale 3 Haralampos-G. Stratigopoulos 4
1 TU Delft - Delft University of Technology
2 University of Cyprus [Nicosia]
3 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
4 CIAN - Circuits Intégrés Numériques et Analogiques
LIP6 - Laboratoire d'Informatique de Paris 6
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-01499309
Contributor : Caroline Lebrun <>
Submitted on : Friday, March 31, 2017 - 11:10:00 AM
Last modification on : Tuesday, September 1, 2020 - 11:32:04 AM

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  • HAL Id : lirmm-01499309, version 1

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LIRMM | CNRS | UPMC | LIP6 | LIRMM_MIC | MIC | SYSMIC | MIPS | LIP6-CIAN | UNIV-MONTPELLIER | TEST | SORBONNE-UNIVERSITE | SU-SCIENCES

Citation

Said Hamdioui, Maria Michael, Giorgio Di Natale, Haralampos-G. Stratigopoulos. Proceedings of IEEE European Test Symposium (ETS 2016). ETS: European Test Symposium, May 2016, Amsterdam, Netherlands. IEEE, 2016. ⟨lirmm-01499309⟩

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