Arnaud Virazel, Imran Wali, Bastien Deveautour, Alberto Bosio, Patrick Girard, et al.. A Low-Cost Reliability vs. Cost Trade-Off Methodology to Selectively Harden Logic Circuits.
Journal of Electronic Testing, Springer Verlag, 2017, 33 (1), pp.25-36.
⟨10.1007/s10836-017-5640-6⟩.
⟨lirmm-01718568⟩