Ghita Harcha, Alberto Bosio, Patrick Girard, Arnaud Virazel, Paolo Bernardi. An effective fault-injection framework for memory reliability enhancement perspectives.
DTIS: Design and Technology of Integrated Systems in Nanoscale Era, Apr 2017, Palma de Mallorca, Spain.
⟨10.1109/DTIS.2017.7930172⟩.
⟨lirmm-01718579⟩