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Encryption of test data: which cipher is better?

Mathieu da Silva 1 Emanuele Valea 1 Marie-Lise Flottes 1 Sophie Dupuis 1 Giorgio Di Natale 1 Bruno Rouzeyre 1 
1 TEST - Test and dEpendability of microelectronic integrated SysTems
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
Abstract : Testing is a mandatory step in the Integrated Circuit (IC) production because it ensures the required quality of the devices. The most common solution for easing IC testing is the scan chain insertion. This way, a tester can control and observe the internal states of the circuit through dedicated pins. However, a malicious user can exploit this infrastructure in order to extract secret information stored inside the chip. This is the case for cryptographic circuits where partially encrypted results can be observed by shifting out the scan chain content and exploited to retrieve secret keys. Existing countermeasures consist in encrypting the scan content, ensuring the confidentiality of the exchanged messages between the circuit and the tester. The encryption techniques that have been proposed so far rely on the use of two different ciphers: stream ciphers and block ciphers. In this paper, we present pros and cons of both solutions in terms of security and performance. The purpose is to provide an overview of the state-of-the-art in test data encryption and to give elements of comparison between the two ciphers.
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Submitted on : Tuesday, September 4, 2018 - 10:44:50 AM
Last modification on : Friday, August 5, 2022 - 3:03:29 PM
Long-term archiving on: : Wednesday, December 5, 2018 - 1:01:16 PM


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Mathieu da Silva, Emanuele Valea, Marie-Lise Flottes, Sophie Dupuis, Giorgio Di Natale, et al.. Encryption of test data: which cipher is better?. PRIME: PhD Research in Microelectronics and Electronics, Jul 2018, Prague, Czech Republic. pp.85-88, ⟨10.1109/PRIME.2018.8430366⟩. ⟨lirmm-01867249⟩



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