Analog test: Why still “à la mode” after more than 25 years of research? - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2015

Analog test: Why still “à la mode” after more than 25 years of research?


Summary form only given. The test of analog, mixed-signal and RF circuits has been a topic of active research for more than 25 years. Many ideas have been presented at conferences and published in journals. Despite this strong activity, it is still a hot topic that attracts many submissions in major test conferences. Does this mean that all ideas proposed so far are useless or, instead, is the domain in constant evolution facing new challenges that necessitate novel ideas? Panelists both from industry and academia, all experts in the domain, will present their arguments on the reason for longevity of the analog test topic and will give their view on the future of this topic, if any... In particular, the following questions will be discussed in this panel: - Is the topic of analog test still “à la mode”? For academia, industry or both? - What are the changes in the past decade that makes the topic still interesting in 2015? - Are there problems already solved? In which area? - Are there problems that still need to be solved? Which aspects are the more relevant for the future? Which analog devices will pose the hardest problems? - Is academia solving the real problems? Is industry providing the right means to solve their real problems, internally or by collaboration? - What could be done as a Community to speed-up progress on analog testing? - Etc.


Logic [math.LO]
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Dates and versions

lirmm-01922917 , version 1 (14-11-2018)



Florence Azaïs. Analog test: Why still “à la mode” after more than 25 years of research?. ETS: European Test Symposium, May 2015, Cluj-Napoca, Romania. ⟨10.1109/ETS.2015.7138772⟩. ⟨lirmm-01922917⟩
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