 |
HAL-LIRMM - Open Archive |  |
Conference papers
A Multiple Fault Localization Approach based on Multicriteria Analytical Hierarchy Process
Abstract : Fault localization problem is one of the most difficult processes in software debugging. Several spectrum-based ranking metrics have been proposed and none is shown to be empirically optimal. In this paper, we consider the fault localization problem as a multicriteria decision making problem. The proposed approach tackles the different metrics by aggregating them into a single metric using a weighted linear formulation. A learning step is used to maintain the right expected weights of criteria. This approach is based on Analytic Hierarchy Process (AHP), where a ranking is given to a statement in terms of suspiciousness according to a comparison of ranks given by the different metrics. Experiments performed on standard benchmark programs show that our approach enables to propose a more precise localization than existing spectrum-based metrics.
Cited literature [28 references]
https://hal-lirmm.ccsd.cnrs.fr/lirmm-02089746
Contributor : Nadjib Lazaar <>
Submitted on : Thursday, April 4, 2019 - 10:16:20 AM
Last modification on : Monday, January 11, 2021 - 5:24:10 PM
Long-term archiving on: : Friday, July 5, 2019 - 12:51:13 PM
Contributor : Nadjib Lazaar <>
Submitted on : Thursday, April 4, 2019 - 10:16:20 AM
Last modification on : Monday, January 11, 2021 - 5:24:10 PM
Long-term archiving on: : Friday, July 5, 2019 - 12:51:13 PM
File
AITest19-ahploc.pdf
Files produced by the author(s)