BISTing Datapaths under Heterogeneous Test Schemes - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Journal Articles Journal of Electronic Testing: : Theory and Applications Year : 1999

BISTing Datapaths under Heterogeneous Test Schemes

Abstract

In this paper, we present a fast and efficient algorithm for BISTing datapaths described at the Register Transfer (RT) level. This algorithm is parameterized by user defined tuning factors allowing tradeoffs between fault coverage, area overhead and test application time. This algorithm is generic in the sense it handle and mixes heterogeneous test pattern generators and compactors.

Dates and versions

lirmm-02288809 , version 1 (16-09-2019)

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David Berthelot, Marie-Lise Flottes, Bruno Rouzeyre. BISTing Datapaths under Heterogeneous Test Schemes. Journal of Electronic Testing: : Theory and Applications, 1999, 14 (1/2), pp.115-123. ⟨10.1023/A:1008309625123⟩. ⟨lirmm-02288809⟩
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