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Conference papers

A Comprehensive Approach to a Trusted Test Infrastructure

Marc Merandat 1, 2 Vincent Reynaud 3 Emanuele Valea 4 Jerome Quevremont 2 Nicolas Valette 1, 2 Paolo Maistri 3 Régis Leveugle 3 Marie-Lise Flottes 4 Sophie Dupuis 4 Bruno Rouzeyre 4 Giorgio Di Natale 3
1 INVIA
2 THALES [France]
3 TIMA - Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés
4 TEST - TEST
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
Abstract : The testability of electronic devices is of critical importance and it is often supported by IEEE standards. The available methods, on the other hand, can be an entry point to a malicious attacker, if no proper countermeasure is adopted. In this paper, we report the latest results from the HADES project, presenting a portfolio of solution towards a secure test infrastructure.
Keywords : Test Scan chains IEEE 1687 BIST Authentication Scan chain encryption
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Submitted on : Monday, October 7, 2019 - 11:12:27 AM
Last modification on : Monday, April 4, 2022 - 10:40:41 AM

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LIRMM | CNRS | MIC | LIRMM_MIC | MIPS | UNIV-MONTPELLIER | TIMA | TEST | UGA | AXESECULIRMM

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Marc Merandat, Vincent Reynaud, Emanuele Valea, Jerome Quevremont, Nicolas Valette, et al.. A Comprehensive Approach to a Trusted Test Infrastructure. IVSW 2019 - 4th IEEE International Verification and Security Workshop, Jul 2019, Rhodes, Greece. pp.43-48, ⟨10.1109/IVSW.2019.8854428⟩. ⟨lirmm-02306980⟩

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