A Comprehensive Approach to a Trusted Test Infrastructure

Marc Merandat 1, 2 Vincent Reynaud 3 Emanuele Valea 4 Jerome Quevremont 2 Nicolas Valette 1, 2 Paolo Maistri 3 Régis Leveugle 3 Marie-Lise Flottes 4 Sophie Dupuis 4 Bruno Rouzeyre 4 Giorgio Di Natale 3
1 INVIA
2 THALES
3 TIMA - Techniques of Informatics and Microelectronics for integrated systems Architecture
4 TEST - TEST
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
Abstract : The testability of electronic devices is of critical importance and it is often supported by IEEE standards. The available methods, on the other hand, can be an entry point to a malicious attacker, if no proper countermeasure is adopted. In this paper, we report the latest results from the HADES project, presenting a portfolio of solution towards a secure test infrastructure.
Keywords : Test Scan chains IEEE 1687 BIST Authentication Scan chain encryption
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Conference papers
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Submitted on : Monday, October 7, 2019 - 11:12:27 AM
Last modification on : Thursday, October 10, 2019 - 1:03:38 AM

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  • HAL Id : lirmm-02306980, version 1

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LIRMM | CNRS | MIC | LIRMM_MIC | MIPS | UNIV-MONTPELLIER | TIMA | TEST | UGA

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Marc Merandat, Vincent Reynaud, Emanuele Valea, Jerome Quevremont, Nicolas Valette, et al.. A Comprehensive Approach to a Trusted Test Infrastructure. IVSW: International Verification and Security Workshop, Jul 2019, Rhodes, Greece. ⟨lirmm-02306980⟩

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