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Information Assurance through Redundant Design: A Novel TNU Error Resilient Latch for Harsh Radiation Environment

Aibin Yan 1 Yuanjie Hu Jie Cui Zhili Chen Patrick Girard 2 Xiaoqing Wen 3
2 TEST - TEST
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
Abstract : In nano-scale CMOS technologies, storage cells such as latches are becoming increasingly sensitive to triple-node-upset (TNU) errors caused by harsh radiation effects. In the context of information assurance through redundant design, this article proposes a novel low-cost and TNU on-line self-recoverable latch design which is robust against harsh radiation effects. The latch mainly consists of a series of mutually interlocked 3-input Muller C-elements (CEs) that forms a circular structure. The output of any CE in the latch respectively feeds back to one input of some specified downstream CEs, making the latch completely self-recoverable from any possible TNU, i.e., the latch is completely TNU-resilient. Simulation results demonstrate the complete TNU-resiliency of the proposed latch. In addition, due to the use of fewer transistors and a high-speed path, the proposed latch reduces the delay-power-area product by approximately 91 percent compared with the state-of-the-art TNU hardened latch (TNUHL), which cannot provide a complete TNU-resiliency.
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-02395602
Contributor : Patrick Girard <>
Submitted on : Thursday, December 5, 2019 - 3:37:25 PM
Last modification on : Thursday, October 29, 2020 - 11:25:55 AM

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Aibin Yan, Yuanjie Hu, Jie Cui, Zhili Chen, Patrick Girard, et al.. Information Assurance through Redundant Design: A Novel TNU Error Resilient Latch for Harsh Radiation Environment. IEEE Transactions on Computers, Institute of Electrical and Electronics Engineers, 2020, 69 (6), pp.789-799. ⟨10.1109/TC.2020.2966200⟩. ⟨lirmm-02395602⟩

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