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Information Assurance through Redundant Design: A Novel TNU Error Resilient Latch for Harsh Radiation Environment

Aibin Yan 1 Yuanjie Hu Jie Cui Zhili Chen Patrick Girard 2 Xiaoqing Wen 3
2 TEST - TEST
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-02395602
Contributor : Patrick Girard <>
Submitted on : Thursday, December 5, 2019 - 3:37:25 PM
Last modification on : Saturday, December 7, 2019 - 1:41:47 AM

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  • HAL Id : lirmm-02395602, version 1

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Aibin Yan, Yuanjie Hu, Jie Cui, Zhili Chen, Patrick Girard, et al.. Information Assurance through Redundant Design: A Novel TNU Error Resilient Latch for Harsh Radiation Environment. IEEE Transactions on Computers, Institute of Electrical and Electronics Engineers, In press. ⟨lirmm-02395602⟩

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