Skip to Main content Skip to Navigation
Conference papers

EVM measurement of RF ZigBee transceivers using standard digital ATE

Thibault Vayssade 1 Florence Azaïs 1 Laurent Latorre 1 François Lefèvre 2
1 TEST - TEST
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
Abstract : This paper targets the challenging issue of production test cost reduction for RF circuits. More specifically, it proposes a low-cost solution to perform EVM measurement of ZigBee transceivers using only a standard digital test equipment. The approach is based on 1-bit under-sampled acquisition of the RF modulated-signal by a digital tester channel associated with a specifically-tailored processing algorithm. The different steps of the post-processing algorithm are detailed in the paper. Hardware experimental results obtained on both a Universal Software Radio Peripheral (USRP) that emulates the circuit-under-test and on an actual ZigBee transceiver IC are presented.
Complete list of metadata

Cited literature [9 references]  Display  Hide  Download

https://hal-lirmm.ccsd.cnrs.fr/lirmm-03000882
Contributor : Florence Azais <>
Submitted on : Thursday, November 12, 2020 - 10:26:58 AM
Last modification on : Monday, April 19, 2021 - 9:50:03 AM
Long-term archiving on: : Saturday, February 13, 2021 - 6:52:26 PM

Identifiers

Citation

Thibault Vayssade, Florence Azaïs, Laurent Latorre, François Lefèvre. EVM measurement of RF ZigBee transceivers using standard digital ATE. IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), Oct 2020, Frascati, Italy. pp.1-6, ⟨10.1109/DFT50435.2020.9250900⟩. ⟨lirmm-03000882⟩

Share

Metrics

Record views

41

Files downloads

82