EVM measurement of RF ZigBee transceivers using standard digital ATE - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2020

EVM measurement of RF ZigBee transceivers using standard digital ATE

Abstract

This paper targets the challenging issue of production test cost reduction for RF circuits. More specifically, it proposes a low-cost solution to perform EVM measurement of ZigBee transceivers using only a standard digital test equipment. The approach is based on 1-bit under-sampled acquisition of the RF modulated-signal by a digital tester channel associated with a specifically-tailored processing algorithm. The different steps of the post-processing algorithm are detailed in the paper. Hardware experimental results obtained on both a Universal Software Radio Peripheral (USRP) that emulates the circuit-under-test and on an actual ZigBee transceiver IC are presented.
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Dates and versions

lirmm-03000882 , version 1 (12-11-2020)

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Cite

Thibault Vayssade, Florence Azaïs, Laurent Latorre, François Lefèvre. EVM measurement of RF ZigBee transceivers using standard digital ATE. DFT 2020 - 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2020, Frascati, Italy. pp.1-6, ⟨10.1109/DFT50435.2020.9250900⟩. ⟨lirmm-03000882⟩
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