Learning-Based Cell-Aware Defect Diagnosis of Customer Returns
Abstract
In this paper, we propose a new framework for cellaware defect diagnosis of customer returns based on supervised learning. The proposed method comprehensively deals with static and dynamic defects that may occur in real circuits. A Naive Bayes classifier is used to precisely identify defect candidates. Results obtained on benchmark circuits, and comparison with a commercial cell-aware diagnosis tool, demonstrate the efficiency of the proposed approach in terms of accuracy and resolution.
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