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A Plug and Play Digital ABIST Controller for Analog Sensors in Secure Devices

Sébastien Lapeyre 1 Nicolas Valette 2 Marc Merandat 2 Marie-Lise Flottes 1 Bruno Rouzeyre 1 Arnaud Virazel 1 
1 TEST - Test and dEpendability of microelectronic integrated SysTems
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
Abstract : Secure devices embed analog sensors in order to measure some physical/environmental parameters which can alter its behavior such as temperature, voltage and electromagnetic field. To ensure the device security all along its lifetime, it is necessary to rely on those analog sensors. Consequently, test solutions must be designed and proceed at each step of the system life cycle, considering inherent constraints of each cycle, i.e., absent or defective software in the chip or chip in user’s hand for example. In this paper, we present a plug and play digital ABIST controller which allows to run external or internal autonomous built-in self-test phases on a temperature sensor used as case study. The external test mode is fully compliant with the IEEE Std. 1149.1 while the internal test one is controlled by the embedded CPU through a system bus.
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Submitted on : Thursday, October 14, 2021 - 2:12:48 PM
Last modification on : Friday, August 5, 2022 - 3:03:29 PM
Long-term archiving on: : Saturday, January 15, 2022 - 6:58:20 PM


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Sébastien Lapeyre, Nicolas Valette, Marc Merandat, Marie-Lise Flottes, Bruno Rouzeyre, et al.. A Plug and Play Digital ABIST Controller for Analog Sensors in Secure Devices. ETS 2021 - 26th IEEE European Test Symposium, May 2021, Bruges, Belgium. pp.1-4, ⟨10.1109/ETS50041.2021.9465480⟩. ⟨lirmm-03305266⟩



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