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Technology Impact on Neutron-Induced Effects in SDRAMs: A Comparative Study

Abstract : This study analyses the response of synchronous dynamic random access memories to neutron irradiation. Three different generations of the same device with different node sizes (63, 72, and 110 nm) were characterized under an atmospheric-like neutron spectrum at the ChipIr beamline in the Rutherford Appleton Laboratories, UK. The memories were tested with a reduced refresh rate to expose more single-event upsets and under similar conditions provided by a board specifically developed for this type of study in test facilities. The board has also been designed to be used as a nanosatellite payload in order to perform similar tests. The neutron-induced failures were studied and characterized, presenting the occurrence of single-bit upsets and stuck bits. The cross sections for each type of event and technology node show that the 110 nm model is more sensitive to neutron-induced single-event effects than the other models.
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-03357444
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Submitted on : Tuesday, September 28, 2021 - 6:41:48 PM
Last modification on : Monday, October 11, 2021 - 1:24:45 PM

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Lucas Matana Luza, Daniel Söderström, André Martins Pio De Mattos, Eduardo Augusto Bezerra, Carlo Cazzaniga, et al.. Technology Impact on Neutron-Induced Effects in SDRAMs: A Comparative Study. 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS 2021), Jun 2021, Montpellier, France. ⟨10.1109/DTIS53253.2021.9505143⟩. ⟨lirmm-03357444⟩

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