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Journal Articles Microelectronics Reliability Year : 2021

On the evaluation of FPGA radiation benchmarks

Abstract

This paper presents a benchmarking methodology to analyse the failure mechanisms of FPGAs under radiation, using comparative results on the radiation sensitivity of parallel multipliers with different implementations. Atmospheric neutron beam test results of Artix7, Spartan7 and IGLOO2 FPGAs are presented and validated against fault injection campaigns.
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Dates and versions

lirmm-03382368 , version 1 (18-11-2021)

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Gaetan Bricas, Georgios Tsiligiannis, Antoine Touboul, Jérôme Boch, Maria Kastriotou, et al.. On the evaluation of FPGA radiation benchmarks. Microelectronics Reliability, 2021, 126, pp.#114276. ⟨10.1016/j.microrel.2021.114276⟩. ⟨lirmm-03382368⟩
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