Effective techniques for automatically improving the transition delay fault coverage of Self-Test Libraries - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2022

Effective techniques for automatically improving the transition delay fault coverage of Self-Test Libraries

Abstract

In-field test of integrated circuits using Self-Test Libraries (STLs) is a widely used technique specifically suited to guarantee the processor’s correct behavior during the operative lifetime, as mandated by functional safety standards such as ISO26262. Developing STLs for stuck-at faults requires significant manual efforts from test engineers, and targeting delay faults is even more challenging. In order to support this process, in this paper we propose a method to automate the creation of STLs targeting delay faults starting from existing STLs targeting stuck-at faults. The method is based first on identifying excited but not-observed transition delay faults and then adding suitable instructions able to detect them. Experimental results on a RISC-V processor show that the method can systematically detect a significant percentage of the target faults with reasonable computational effort and test code size increase.
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Dates and versions

lirmm-03739788 , version 1 (06-09-2022)

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Cite

Riccardo Cantoro, Francesco Garau, Patrick Girard, Nima Kolahimahmoudi, Sandro Sartoni, et al.. Effective techniques for automatically improving the transition delay fault coverage of Self-Test Libraries. ETS 2022 - 27th IEEE European Test Symposium, May 2022, Barcelona, Spain. pp.1-2, ⟨10.1109/ETS54262.2022.9810392⟩. ⟨lirmm-03739788⟩
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