LDAVPM: A Latch Design and Algorithm-based Verification Protected against Multiple-Node-Upsets in Harsh Radiation Environments - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Journal Articles IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems Year : 2023

LDAVPM: A Latch Design and Algorithm-based Verification Protected against Multiple-Node-Upsets in Harsh Radiation Environments

Aibin Yan
Jie Cui
Zhengfeng Huang
Tianming Ni
Xiaoqing Wen

Abstract

In deep nano-scale and high-integration CMOS technologies, storage circuits have become increasingly sensitive to charge-sharing-induced multiple-node-upsets (MNUs) that include double, triple and quadruple node-upsets. Currently, verifications for error-recovery of existing latches highly rely on EDA tools with complex error-injection combinations. In this paper, a latch design protected against MNUs in harsh radiation as well as an algorithm-based verification process are proposed. Due to the constructed redundant feedback loops, the latch can completely recover from any MNU. Algorithm-based verification and simulations both demonstrate the MNU recovery of the proposed latch. Simulation results demonstrate the low area overhead of the proposed latch compared with the only one existing of the same type.
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Dates and versions

lirmm-03770056 , version 1 (06-09-2022)

Identifiers

Cite

Aibin Yan, Zhixing Li, Jie Cui, Zhengfeng Huang, Tianming Ni, et al.. LDAVPM: A Latch Design and Algorithm-based Verification Protected against Multiple-Node-Upsets in Harsh Radiation Environments. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2023, 42 (6), pp.2069-2073. ⟨10.1109/TCAD.2022.3213212⟩. ⟨lirmm-03770056⟩
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