Designs of Two Quadruple-Node-Upset Self-Recoverable Latches for Highly Robust Computing in Harsh Radiation Environments - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Journal Articles IEEE Transactions on Aerospace and Electronic Systems Year : 2023

Designs of Two Quadruple-Node-Upset Self-Recoverable Latches for Highly Robust Computing in Harsh Radiation Environments

Aibin Yan
Jie Cui
Zhengfeng Huang
Tianming Ni
Xiaoqing Wen

Abstract

This article proposes two quadruple node upset (QNU) recoverable latches, namely QNU-recoverable and high-impedance-state (HIS)-insensitive latch (QRHIL) and QRHIL-LC (low-cost version of the QRHIL), for highly robust computing in harsh radiation environments. First, the QRHIL that mainly consists of a 5×5 looped C-element matrix is proposed. Then, to reduce overhead, the QRHIL-LC that mainly uses 24 interlocking C-elements is proposed. Both latches can self-recover from any QNU, while the QRHIL-LC has a low cost compared to the QRHIL. Simulation waveforms show the QNU-recoverability of the proposed QRHIL and QRHIL-LC latches. Moreover, compared with the QRHIL latch, the QRHIL-LC can approximately save power dissipation by 16% and silicon area by 5%.
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Dates and versions

lirmm-04236216 , version 1 (10-10-2023)

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Aibin Yan, Zhixing Li, Jie Cui, Zhengfeng Huang, Tianming Ni, et al.. Designs of Two Quadruple-Node-Upset Self-Recoverable Latches for Highly Robust Computing in Harsh Radiation Environments. IEEE Transactions on Aerospace and Electronic Systems, 2023, 59 (3), pp.2885-2897. ⟨10.1109/TAES.2022.3219372⟩. ⟨lirmm-04236216⟩
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