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Conference Papers Year : 2006

Testing System-In-Package Wirelessly


The paper shows a new concept for testing a systemin- package (SiP) using a wireless communication. Trends of the SiP technology put more economic and technical constraints onto the test, while the contactless test techniques represent an opportunity to overcome the inherent problems. In this paper, we introduce a new test concept based on a wireless communication, a specific test access mechanism (TAM), and an optimised architecture. Although this approach is dedicated to an intermediate test of SiP, we explore other potential applications of this technology.
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Dates and versions

lirmm-00094916 , version 1 (15-09-2006)


  • HAL Id : lirmm-00094916 , version 1


Serge Bernard, David Andreu, Marie-Lise Flottes, Philippe Cauvet, Hervé Fleury, et al.. Testing System-In-Package Wirelessly. DTIS: Design and Technology of Integrated Systems in Nanoscale Era, Sep 2006, Tunis, Tunisia. pp.222-226. ⟨lirmm-00094916⟩
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