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Electrical Behavior of GOS Fault Affected Domino Logic Cell

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00102703
Contributor : Christine Carvalho de Matos <>
Submitted on : Monday, October 2, 2006 - 3:41:20 PM
Last modification on : Friday, July 20, 2018 - 12:34:01 PM

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  • HAL Id : lirmm-00102703, version 1

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Mariane Comte, Satoshi Ohtake, Hideo Fujiwara, Michel Renovell. Electrical Behavior of GOS Fault Affected Domino Logic Cell. DELTA'06: IEEE International Workshop on Electronics DesignTest & Applications, Jan 2006, Kuala Lumpur, Malaysia, pp.183-189. ⟨lirmm-00102703⟩

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