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HBM and CDM Stress Evaluation at Circuit Level

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00102725
Contributor : Christine Carvalho de Matos <>
Submitted on : Monday, October 2, 2006 - 3:47:57 PM
Last modification on : Thursday, May 24, 2018 - 3:59:24 PM

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  • HAL Id : lirmm-00102725, version 1

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Marie Lafont, Florence Azaïs, Pascal Nouet. HBM and CDM Stress Evaluation at Circuit Level. 06023, 2006, 15 p. ⟨lirmm-00102725⟩

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