Study of a Multi-Chip Circuit under CDM Stress - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Reports Year : 2006
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lirmm-00102726 , version 1 (02-10-2006)

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  • HAL Id : lirmm-00102726 , version 1

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Marie Lafont, Florence Azaïs, Pascal Nouet. Study of a Multi-Chip Circuit under CDM Stress. 06024, 2006, 20 p. ⟨lirmm-00102726⟩
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