Study of a Multi-Chip Circuit under CDM Stress - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier
Reports Year : 2006

Study of a Multi-Chip Circuit under CDM Stress

Christine Carvalho De Matos  : Connect in order to contact the contributor

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00102726

Submitted on : Monday, October 2, 2006-3:47:58 PM

Last modification on : Friday, March 24, 2023-2:52:48 PM

No file

Dates and versions

lirmm-00102726 , version 1 (02-10-2006)

Identifiers

  • HAL Id : lirmm-00102726 , version 1

Cite

Marie Lafont, Florence Azaïs, Pascal Nouet. Study of a Multi-Chip Circuit under CDM Stress. 06024, 2006, 20 p. ⟨lirmm-00102726⟩

Export

BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite

Collections

CNRS SYSMIC LIRMM LARA LIRMM_MIC MIC MIPS UNIV-MONTPELLIER
85 View
0 Download

Share

More