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Study of a Multi-Chip Circuit under CDM Stress

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00102726
Contributor : Christine Carvalho de Matos <>
Submitted on : Monday, October 2, 2006 - 3:47:58 PM
Last modification on : Thursday, May 24, 2018 - 3:59:24 PM

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  • HAL Id : lirmm-00102726, version 1

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Marie Lafont, Florence Azaïs, Pascal Nouet. Study of a Multi-Chip Circuit under CDM Stress. 06024, 2006, 20 p. ⟨lirmm-00102726⟩

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