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Victim and Aggressor Line Electrical Modelisation in an Multicoupled Interconnect Environment for Transient Simulation

Freddy Ponchel 1 Jean-François Legier 1 Erick Paleczny 1 Christophe Seguinot 1 Denis Deschacht 2
1 IEMN - Institut d’Électronique, de Microélectronique et de Nanotechnologie (IEMN) - UMR 8520
2 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
Abstract : An electrical modelisation of eight lossy Cu interconnects is proposed thanks to the implementation of a vector finite element method. This full wave analysis gives frequency dependence of proper or mutual inductance, capacitance or resistance from resulting transmission line equations system. Spice results are then proposed for different set of spacing and low dielectric material in case of interconnects whose area is less than 1 m2 embedded in SiO2 interlevel or other low dielectric material
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Conference papers
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00102776
Contributor : Christine Carvalho de Matos <>
Submitted on : Monday, October 2, 2006 - 4:17:25 PM
Last modification on : Wednesday, April 7, 2021 - 10:32:09 AM

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CNRS | SYSMIC | LIRMM | LIRMM_MIC | MIC | MIPS | UNIV-MONTPELLIER | UNIV-LILLE | UNIV-VALENCIENNES | IEMN

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Freddy Ponchel, Jean-François Legier, Erick Paleczny, Christophe Seguinot, Denis Deschacht. Victim and Aggressor Line Electrical Modelisation in an Multicoupled Interconnect Environment for Transient Simulation. SPI: Signal Propagation on Interconnects, May 2006, Berlin, Germany. pp.249-251, ⟨10.1109/SPI.2006.289235⟩. ⟨lirmm-00102776⟩

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