Victim and Aggressor Line Electrical Modelisation in an Multicoupled Interconnect Environment for Transient Simulation - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2006

Victim and Aggressor Line Electrical Modelisation in an Multicoupled Interconnect Environment for Transient Simulation

Abstract

An electrical modelisation of eight lossy Cu interconnects is proposed thanks to the implementation of a vector finite element method. This full wave analysis gives frequency dependence of proper or mutual inductance, capacitance or resistance from resulting transmission line equations system. Spice results are then proposed for different set of spacing and low dielectric material in case of interconnects whose area is less than 1 m2 embedded in SiO2 interlevel or other low dielectric material
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lirmm-00102776 , version 1 (02-10-2006)

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Freddy Ponchel, Jean-François Legier, Erick Paleczny, Christophe Seguinot, Denis Deschacht. Victim and Aggressor Line Electrical Modelisation in an Multicoupled Interconnect Environment for Transient Simulation. SPI: Signal Propagation on Interconnects, May 2006, Berlin, Germany. pp.249-251, ⟨10.1109/SPI.2006.289235⟩. ⟨lirmm-00102776⟩
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