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Test Application Time Reduction with a Dynamically Reconfigurable Scan Tree Architecture

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00105987
Contributor : Christine Carvalho de Matos <>
Submitted on : Friday, October 13, 2006 - 10:22:43 AM
Last modification on : Wednesday, August 28, 2019 - 3:46:02 PM

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  • HAL Id : lirmm-00105987, version 1

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Yannick Bonhomme, T. Yoneda, Hideo Fujiwara, Patrick Girard. Test Application Time Reduction with a Dynamically Reconfigurable Scan Tree Architecture. DDECS'05: IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, Apr 2005, Sopron, Hungary, pp.19-26. ⟨lirmm-00105987⟩

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