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Peak Power Consumption During Scan Testing: Issue, Analysis and Heuristic Solution

Nabil Badereddine 1 Patrick Girard 1 Serge Pravossoudovitch 1 Christian Landrault 1 Arnaud Virazel 1
1 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00105990
Contributor : Christine Carvalho de Matos <>
Submitted on : Friday, October 13, 2006 - 10:22:44 AM
Last modification on : Friday, November 27, 2020 - 6:04:03 PM

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  • HAL Id : lirmm-00105990, version 1

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Nabil Badereddine, Patrick Girard, Serge Pravossoudovitch, Christian Landrault, Arnaud Virazel. Peak Power Consumption During Scan Testing: Issue, Analysis and Heuristic Solution. DDECS'05: IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, Apr 2005, Sopron, Hungary. pp.151-159. ⟨lirmm-00105990⟩

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