Peak Power Consumption During Scan Testing: Issue, Analysis and Heuristic Solution - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2005
No file

Dates and versions

lirmm-00105990 , version 1 (13-10-2006)

Identifiers

  • HAL Id : lirmm-00105990 , version 1

Cite

Nabil Badereddine, Patrick Girard, Serge Pravossoudovitch, Christian Landrault, Arnaud Virazel. Peak Power Consumption During Scan Testing: Issue, Analysis and Heuristic Solution. DDECS'05: IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, Apr 2005, Sopron, Hungary. pp.151-159. ⟨lirmm-00105990⟩
183 View
0 Download

Share

Gmail Facebook X LinkedIn More