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Power-Aware Scan Testing for Peak Power Reduction

Nabil Badereddine 1 Patrick Girard 1 Serge Pravossoudovitch 1 Arnaud Virazel 1 Christian Landrault 1
1 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00106112
Contributor : Christine Carvalho de Matos <>
Submitted on : Friday, October 13, 2006 - 10:23:14 AM
Last modification on : Friday, November 27, 2020 - 6:04:03 PM

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  • HAL Id : lirmm-00106112, version 1

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Nabil Badereddine, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Christian Landrault. Power-Aware Scan Testing for Peak Power Reduction. VLSI-SOC'05: IFIP International Conference on Very Large Scale Integration, Oct 2005, Perth, Australia. pp.441-446. ⟨lirmm-00106112⟩

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