Power-Aware Scan Testing for Peak Power Reduction - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2005
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lirmm-00106112 , version 1 (13-10-2006)

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  • HAL Id : lirmm-00106112 , version 1

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Nabil Badereddine, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Christian Landrault. Power-Aware Scan Testing for Peak Power Reduction. VLSI-SOC'05: IFIP International Conference on Very Large Scale Integration, Oct 2005, Perth, Australia. pp.441-446. ⟨lirmm-00106112⟩
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