Conference Papers
Year : 2005
Christine Carvalho De Matos : Connect in order to contact the contributor
https://hal-lirmm.ccsd.cnrs.fr/lirmm-00106513
Submitted on : Monday, October 16, 2006-8:38:39 AM
Last modification on : Monday, June 10, 2024-4:58:03 PM
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- HAL Id : lirmm-00106513 , version 1
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Arnaud Regnier, Jean-Michel Portal, Rachid Bouchakour, Michel Renovell. Modeling Halo Implant Failures in MOS Sub-Micron Technology. LATW: Latin American Test Workshop, Mar 2005, Salvador, Bahia, Brazil. pp.29-33. ⟨lirmm-00106513⟩
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