Conference Papers Year : 2004

March Tests Improvements for Address Decoder Open and Resistive Open Fault Detection

Abstract

March Tests Improvements for Address Decoder Open and Resistive Open Fault Detection

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Micro and nanotechnologies/Microelectronics
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00108642

Submitted on : Monday, October 23, 2006-8:52:32 AM

Last modification on : Friday, March 24, 2023-2:52:48 PM

Long-term archiving on : Tuesday, April 6, 2010-8:28:22 PM

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lirmm-00108642 , version 1 (23-10-2006)

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  • HAL Id : lirmm-00108642 , version 1

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Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri, et al.. March Tests Improvements for Address Decoder Open and Resistive Open Fault Detection. LATW: Latin American Test Workshop, Mar 2004, Cartagena, Colombia. pp.31-36. ⟨lirmm-00108642⟩

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