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Conference papers

On the Use of Electrical Stimuli for MEMS Testing

Norbert Dumas 1 Florence Azaïs 1 Laurent Latorre 1 Pascal Nouet 1
1 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
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Conference papers
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00108651
Contributor : Christine Carvalho de Matos <>
Submitted on : Monday, October 23, 2006 - 8:52:38 AM
Last modification on : Thursday, May 24, 2018 - 3:59:24 PM

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  • HAL Id : lirmm-00108651, version 1

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CNRS | SYSMIC | LIRMM | LIRMM_MIC | MIC | MIPS | UNIV-MONTPELLIER

Citation

Norbert Dumas, Florence Azaïs, Laurent Latorre, Pascal Nouet. On the Use of Electrical Stimuli for MEMS Testing. LATW'04: 5th IEEE Latin American Test Workshop, Mar 2004, Cartagena, Spain. pp.118-122. ⟨lirmm-00108651⟩

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