On the Use of Electrical Stimuli for MEMS Testing - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier
Conference Papers Year : 2004

On the Use of Electrical Stimuli for MEMS Testing

Christine Carvalho De Matos  : Connect in order to contact the contributor

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00108651

Submitted on : Monday, October 23, 2006-8:52:38 AM

Last modification on : Friday, March 24, 2023-2:52:48 PM

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lirmm-00108651 , version 1 (23-10-2006)

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  • HAL Id : lirmm-00108651 , version 1

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Norbert Dumas, Florence Azaïs, Laurent Latorre, Pascal Nouet. On the Use of Electrical Stimuli for MEMS Testing. LATW'04: 5th IEEE Latin American Test Workshop, Mar 2004, Cartagena, Spain. pp.118-122. ⟨lirmm-00108651⟩

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