https://hal-lirmm.ccsd.cnrs.fr/lirmm-00108651
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Submitted on : Monday, October 23, 2006 - 8:52:38 AM Last modification on : Thursday, May 24, 2018 - 3:59:24 PM
Norbert Dumas, Florence Azaïs, Laurent Latorre, Pascal Nouet. On the Use of Electrical Stimuli for MEMS Testing. LATW'04: 5th IEEE Latin American Test Workshop, Mar 2004, Cartagena, Spain. pp.118-122. ⟨lirmm-00108651⟩