Conference Papers
Year : 2004
Christine Carvalho De Matos : Connect in order to contact the contributor
https://hal-lirmm.ccsd.cnrs.fr/lirmm-00108659
Submitted on : Monday, October 23, 2006-8:52:41 AM
Last modification on : Tuesday, December 5, 2023-6:08:07 PM
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- HAL Id : lirmm-00108659 , version 1
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S. Bernardini, P. Masson, Jean-Michel Portal, Jean-Marc J.-M. Galliere, Michel Renovell. Impact of Gate Oxide Reduction Failure on Analog Applications: Example of the Current Mirror. LATW: Latin American Test Workshop, Mar 2004, Cartagena, Spain. pp.12-17. ⟨lirmm-00108659⟩
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