Skip to Main content Skip to Navigation
Conference papers

Impact of Gate Oxide Reduction Failure on Analog Applications: Example of the Current Mirror

Complete list of metadata

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00108659
Contributor : Christine Carvalho de Matos <>
Submitted on : Monday, October 23, 2006 - 8:52:41 AM
Last modification on : Thursday, December 3, 2020 - 3:09:50 AM

Identifiers

  • HAL Id : lirmm-00108659, version 1

Citation

S. Bernardini, P. Masson, Jean-Michel Portal, Jean-Marc Galliere, Michel Renovell. Impact of Gate Oxide Reduction Failure on Analog Applications: Example of the Current Mirror. LATW: Latin American Test Workshop, Mar 2004, Cartagena, Spain. pp.12-17. ⟨lirmm-00108659⟩

Share

Metrics

Record views

101