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Impact of Gate Oxide Reduction Failure on Analog Applications: Example of the Current Mirror

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00108659
Contributor : Christine Carvalho de Matos <>
Submitted on : Monday, October 23, 2006 - 8:52:41 AM
Last modification on : Tuesday, September 24, 2019 - 12:04:01 PM

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  • HAL Id : lirmm-00108659, version 1

Citation

S. Bernardini, P. Masson, Jean-Michel Portal, Jean-Marc Galliere, Michel Renovell. Impact of Gate Oxide Reduction Failure on Analog Applications: Example of the Current Mirror. LATW: Latin American Test Workshop, Mar 2004, Cartagena, Spain. pp.12-17. ⟨lirmm-00108659⟩

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