Impact of Gate Oxide Reduction Failure on Analog Applications: Example of the Current Mirror - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier
Conference Papers Year : 2004

Impact of Gate Oxide Reduction Failure on Analog Applications: Example of the Current Mirror

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Micro and nanotechnologies/Microelectronics

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00108659

Submitted on : Monday, October 23, 2006-8:52:41 AM

Last modification on : Tuesday, December 5, 2023-6:08:07 PM

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lirmm-00108659 , version 1 (23-10-2006)

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  • HAL Id : lirmm-00108659 , version 1

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S. Bernardini, P. Masson, Jean-Michel Portal, Jean-Marc J.-M. Galliere, Michel Renovell. Impact of Gate Oxide Reduction Failure on Analog Applications: Example of the Current Mirror. LATW: Latin American Test Workshop, Mar 2004, Cartagena, Spain. pp.12-17. ⟨lirmm-00108659⟩

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