Impact of Gate Oxide Reduction Failure on Analog Applications: Example of the Current Mirror - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2004
No file

Dates and versions

lirmm-00108659 , version 1 (23-10-2006)

Identifiers

  • HAL Id : lirmm-00108659 , version 1

Cite

S. Bernardini, P. Masson, Jean-Michel Portal, Jean-Marc J.-M. Galliere, Michel Renovell. Impact of Gate Oxide Reduction Failure on Analog Applications: Example of the Current Mirror. LATW: Latin American Test Workshop, Mar 2004, Cartagena, Spain. pp.12-17. ⟨lirmm-00108659⟩
79 View
0 Download

Share

Gmail Mastodon Facebook X LinkedIn More