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On Using Test Vector Differences for Reducing Test Pin Numbers

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00108832
Contributor : Christine Carvalho de Matos <>
Submitted on : Monday, October 23, 2006 - 12:56:44 PM
Last modification on : Tuesday, October 23, 2018 - 10:46:02 AM

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  • HAL Id : lirmm-00108832, version 1

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Marie-Lise Flottes, Régis Poirier, Bruno Rouzeyre. On Using Test Vector Differences for Reducing Test Pin Numbers. DELTA'04: 2nd International Workshop on Electronic DesignTest and Applications, Jan 2004, Perth (Australia), pp.275-280. ⟨lirmm-00108832⟩

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