On Using Test Vector Differences for Reducing Test Pin Numbers - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier
Conference Papers Year : 2004

On Using Test Vector Differences for Reducing Test Pin Numbers

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Micro and nanotechnologies/Microelectronics

Christine Carvalho De Matos  : Connect in order to contact the contributor

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00108832

Submitted on : Monday, October 23, 2006-12:56:44 PM

Last modification on : Friday, March 24, 2023-2:52:48 PM

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lirmm-00108832 , version 1 (23-10-2006)

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  • HAL Id : lirmm-00108832 , version 1

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Marie-Lise Flottes, Régis Poirier, Bruno Rouzeyre. On Using Test Vector Differences for Reducing Test Pin Numbers. DELTA'04: 2nd International Workshop on Electronic DesignTest and Applications, Jan 2004, Perth (Australia), pp.275-280. ⟨lirmm-00108832⟩

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