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Conference Papers Year : 2004

The Pros and Cons of Very-Low-Voltage Testing: An Analysis Based on Resistive Bridging Faults

P. Engelke
  • Function : Author
I. Polian
  • Function : Author
B. Seshadri
  • Function : Author
P. Becker
  • Function : Author
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lirmm-00108845 , version 1 (23-10-2006)

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  • HAL Id : lirmm-00108845 , version 1

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P. Engelke, I. Polian, Michel Renovell, B. Seshadri, P. Becker. The Pros and Cons of Very-Low-Voltage Testing: An Analysis Based on Resistive Bridging Faults. VTS'04: 22nd IEEE VLSI Test Symposium, Apr 2004, Napa Valley, CA (USA), pp.171-178. ⟨lirmm-00108845⟩
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