P. Engelke, I. Polian, Michel Renovell, B. Seshadri, P. Becker. The Pros and Cons of Very-Low-Voltage Testing: An Analysis Based on Resistive Bridging Faults.
VTS'04: 22nd IEEE VLSI Test Symposium, Apr 2004, Napa Valley, CA (USA), pp.171-178, 2004.
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