Skip to Main content Skip to Navigation
Conference papers

Temperature Dependence in Low Power CMOS UDSM Process

Abstract : In low power UDSM process the combined use of reduced value of the supply voltage and high threshold voltage value may greatly modify the temperature sensitivity of designs, which becomes structure and transition edge dependent. In this paper we propose a model for determining the temperature coefficient of CMOS structures and defining the worst Process, Voltage and Temperature condition to be verified for qualifying a design. This model is validated on two 0.13μm processes by comparing the calculated values of the temperature coefficient of the performance parameters to values deduced from electrical simulations (Eldo). Application to combinatorial path gives evidence of the occurrence of temperature inversion that is structure and control condition dependent and must carefully be considered for robust design validation.
Complete list of metadatas

Cited literature [10 references]  Display  Hide  Download

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00108893
Contributor : Christine Carvalho de Matos <>
Submitted on : Friday, September 13, 2019 - 7:59:51 PM
Last modification on : Friday, September 13, 2019 - 8:09:35 PM
Long-term archiving on: : Saturday, February 8, 2020 - 8:05:26 PM

File

ark__67375_HCB-FBN29HG1-R.pdf
Publisher files allowed on an open archive

Identifiers

Collections

Citation

Benoit Lasbouygues, Robin Wilson, Philippe Maurine, Nadine Azemard, Daniel Auvergne. Temperature Dependence in Low Power CMOS UDSM Process. PATMOS: Power And Timing Modeling, Optimization and Simulation, Sep 2004, Santorini, Greece. pp.111-118, ⟨10.1007/978-3-540-30205-6_13⟩. ⟨lirmm-00108893⟩

Share

Metrics

Record views

214

Files downloads

565